Beschreibung
InhaltsangabeIntroduction to particle beam formation.- Methods of fields calculation.- Fundamentals of charged-particle motion.- Motion of intense charged-particle beams.- Electron guns.- Electron and ion sources with field and plasma emitters.- Magnetic focusing systems.- Electrostatic focusing systems.- Optical systems of technological installations.- Intense relativistic charged-particle beams.- Multiple-beam electron-optical systems.- Methods of experimental investigation of beams.
Produktsicherheitsverordnung
Hersteller:
Springer Verlag GmbH
juergen.hartmann@springer.com
Tiergartenstr. 17
DE 69121 Heidelberg
Autorenportrait
Inhaltsangabeto Particle-Beam Formation.- Methods of Fields Calculation.- Fundamentals of Charged-Particle Motion.- Motion of Intense Charged-Particle Beams.- Electron Guns.- Electron and Ion Sources with Field and Plasma Emitters.- Magnetic Focusing Systems.- Electrostatic Focusing Systems.- Optical Systems of Technological Installations.- Intense Relativistic Charged-Particle Beams.- Multiple-Beam Electron-Optical Systems.- Methods of Experimental Investigation of Beams.
